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2020 IEEE European Test Symposium (ETS) ,
1
Efficient Prognostication of Pattern Count with Different I..:
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2020 IEEE International Test Conference (ITC) ,
2
Prediction of Test Pattern Count and Test Data Volume for S..:
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2020 IEEE International Test Conference in Asia (ITC-Asia) ,
3
Estimation of Test Data Volume for Scan Architectures with ..:
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Proceedings of the 31st ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering ,
5
P4b: A Translator from P4 Programs to Boogie:
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2020 IEEE 70th Electronic Components and Technology Conference (ECTC) ,
6
Stretchability of Serpentine Interconnect on Polymer Substr..:
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2024 20th IEEE International Colloquium on Signal Processing & Its Applications (CSPA) ,
7
Grey Box Non-Recursive System Identification for a Third Or..:
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2020 European Navigation Conference (ENC) ,
8
Spatial Analysis of the Correlation between Scintillation P..:
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2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) ,
9
Stochastic Sparse Subspace Clustering:
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2019 IEEE/CVF International Conference on Computer Vision (ICCV) ,
10
Is an Affine Constraint Needed for Affine Subspace Clusteri..:
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2019 IEEE/CVF International Conference on Computer Vision Workshop (ICCVW) ,
11
Classifying and Comparing Approaches to Subspace Clustering..:
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2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) ,
12
Self-Supervised Convolutional Subspace Clustering Network:
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2023 IEEE 11th Conference on Systems, Process & Control (ICSPC) ,
13
Hand Gesture Recognition with Deep Convolutional Neural Net..:
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2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC) ,
14
Characterization of Insertion Loss of Striplines on Various..:
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