Yoon, Sangjin
8  Ergebnisse:
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1

A 192-Gb 12-High 896-GB/s HBM3 DRAM with a TSV Auto-Calibra..:

, In: 2022 IEEE International Solid- State Circuits Conference (ISSCC),
Park, Myeong-Jae ; Cho, Ho Sung ; Yun, Tae-Sik... - p. 444-446 , 2022
 
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2

Highly Reliable 28nm Embedded Flash Process Development for..:

, In: 2021 IEEE International Memory Workshop (IMW),
 
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3

Study on defect reduction for high aspect ratio etch proces:

, In: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Lee, Jinseok ; Kim, Myoungwoon ; Lee, Jaebong... - p. 212-216 , 2017
 
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4

An enhanced spider web chart method for climate change risk..:

, In: 2017 International Conference on Information and Communication Technology Convergence (ICTC),
 
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5

A study on film thickness control of vertical flow showerhe..:

, In: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Lee, Guensuk ; Kim, Suhong ; Seok, Seunghyun... - p. 217-221 , 2017
 
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6

Climate change risk assessment method for electrical facili..:

, In: 2016 International Conference on Information and Communication Technology Convergence (ICTC),
Jeong, Sangjin ; An, Yoon-Young - p. 184-188 , 2016
 
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7

Performance Improvement of the Combined AMC-MIMO Systems wi..:

, In: The 2nd International Conference on Wireless Broadband and Ultra Wideband Communications (AusWireless 2007),
Ryoo, Sangjin ; Choi, Kwangwook ; Lee, Kyunghwan... - p. None , 2007
 
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8

Tutorial: Web hacking & defensing — Web hacking is nothing ..:

, In: 2017 19th International Conference on Advanced Communication Technology (ICACT),
Byeong-Nam Yoon, Thomas ; Sang-jin, Oh - p. xxix-xxx , 2017
 
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