Ast, David F.
6  Ergebnisse:
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1

The value and significance of small-scale point-to-sphere b..:

, In: Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1970,
Ast, Paul F. - p. 203-212 , 1970
 
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3

Software metrics artifacts making web quality measurable ..:

, In: Proceedings of the 14th International Workshop on Automation of Software Test,
 
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4

Process restricted AST : an assessment of group support ..:

, In: Proceedings of the 20th international conference on Information Systems,
 
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5

MUT: Human-in-the-Loop Unit Test Migration:

, In: 2024 IEEE/ACM 46th International Conference on Software Engineering (ICSE),
Gao, Yi ; Hu, Xing ; Xu, Tongtong... - p. 2832-2843 , 2024
 
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6

Exploiting Implicit Parallelism in Dynamic Array Programmin..:

, In: Proceedings of ACM SIGPLAN International Workshop on Libraries, Languages, and Compilers for Array Programming,
Imam, Shams ; Sarkar, Vivek ; Leibs, David. - p. 1-7 , 2014
 
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