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Angle-Resolved Photoelectron Spectroscopy at Surfaces With ..:
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Proceedings of the May 16-19, 1983, national computer conference ,
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A new look at existence dependency in databases:
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Measurement of NK Cell Phenotype and Activity in Humans:
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2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
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STT-MRAM Product Reliability and Cross-Talk:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
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Extended MTJ TDDB Model, and Improved STT-MRAM Reliability ..:
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2020 IEEE Symposium on VLSI Technology ,
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A Reliable TDDB Lifetime Projection Model Verified Using 40..:
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2020 IEEE Symposium on VLSI Technology ,
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Fast Switching of STT-MRAM to Realize High Speed Applicatio..:
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Water Resources Development and Management; ICDSME 2019 ,
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Potential Issues Faced on Reservoir-Triggered Earthquakes i..:
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8th International Conference on Advances in Power System Control, Operation and Management (APSCOM 2009) ,
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Application of partial discharge mapping technology in CLP ..:
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2008 IEEE International Electron Devices Meeting ,
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Approaching fermi level unpinning in Oxide-In0.2Ga0.8As:
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2022 International Electron Devices Meeting (IEDM) ,
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