Ito, Sae
2  Ergebnisse:
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1

Well layer thickness dependence on threshold current of SCH..:

, In: 2022 28th International Semiconductor Laser Conference (ISLC),
Yada, Ryosuke ; Agata, Kouji ; Zhao, Liang... - p. 1-2 , 2022
 
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2

Method of Evaluating the Influence Factor of Safety in the ..:

, In: Communications in Computer and Information Science; Systems, Software and Services Process Improvement,
Ito, Masao - p. 161-172 , 2018
 
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