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2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
Reversible and Irreversible Polarization Degradation of Hf0..:
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Lecture Notes in Electrical Engineering; Proceedings of China SAE Congress 2023: Selected Papers ,
2
Research on Split Lubrication Technology for Gasoline Engin..:
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Advances in Real-Time Intelligent Systems; Lecture Notes in Networks and Systems ,
3
Research on Gaussian Mixture Computational Learning Mode Ba..:
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Lecture Notes in Electrical Engineering; Proceedings of China SAE Congress 2023: Selected Papers ,
4
Simulation on Vertical Displacement and Vertical Force Dist..:
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Lecture Notes in Electrical Engineering; The Proceedings of the 18th Annual Conference of China Electrotechnical Society ,
5
A Data-Driven Algorithm for Short Circuit Fault Diagnosis o..:
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Lecture Notes in Electrical Engineering; Proceedings of 2023 7th Chinese Conference on Swarm Intelligence and Cooperative Control ,
6
Real-Time Anomaly Traffic Data Identification Method for Co..:
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2024 IEEE 7th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC) ,
7
Research on Binocular Stereo Vision Calibration Technology ..:
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Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design ,
8
Fault-Tolerant General Purposed Processors:
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2023 2nd International Conference on Automation, Robotics and Computer Engineering (ICARCE) ,
9
Research on Driving Reliability Evaluation Method under a R..:
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Lecture Notes in Electrical Engineering; The Proceedings of the 17th Annual Conference of China Electrotechnical Society ,
10
Analysis of Cogging Torque of Yokeless and Segmented Armatu..:
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2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
11
Layer-Puzzle: Allocating and Scheduling Multi-task on Multi..:
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Lecture Notes in Electrical Engineering; Advances in Guidance, Navigation and Control ,
12
A New Threshold-Free RAIM Based on Monte Carlo Sampling:
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2023 IEEE Industry Applications Society Annual Meeting (IAS) ,
14
Development of Real-time High-Density Pulsar Data Transmiss..:
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Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design ,
15