Nyman, Thomas
10  Ergebnisse:
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1

Exploring the Environmental Benefits of In-Process Isolatio..:

, In: 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S),
 
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2

Rewind & Discard: Improving Software Resilience using Isola..:

, In: 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN),
 
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3

Friend or Foe Inside? Exploring In-Process Isolation to Mai..:

, In: 2023 IEEE Secure Development Conference (SecDev),
 
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4

Authenticated Call Stack:

, In: Proceedings of the 56th Annual Design Automation Conference 2019,
 
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5

Protecting the stack with PACed canaries:

, In: Proceedings of the 4th Workshop on System Software for Trusted Execution,
 
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6

HardScope : Hardening Embedded Systems Against Data-Orie..:

, In: Proceedings of the 56th Annual Design Automation Conference 2019,
 
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7

LO-FAT : Low-Overhead Control Flow ATtestation in Hardwa..:

, In: Proceedings of the 54th Annual Design Automation Conference 2017,
 
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8

C-FLAT : Control-Flow Attestation for Embedded Systems S..:

, In: Proceedings of the 2016 ACM SIGSAC Conference on Computer and Communications Security,
Abera, Tigist ; Asokan, N. ; Davi, Lucas... - p. 743-754 , 2016
 
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9

Citizen Electronic Identities using TPM 2.0:

, In: Proceedings of the 4th International Workshop on Trustworthy Embedded Devices,
Nyman, Thomas ; Ekberg, Jan-Erik ; Asokan, N. - p. 37-48 , 2014
 
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10

List of Contributors:

, In: Conn's Handbook of Models for Human Aging,
 
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