Anger, Sabrina
5  Ergebnisse:
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1

Combining Full Wafer Inspection with Deep Learning to Recog..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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2

Smart Platform for Rapid Prototyping: A First Solution Appr..:

, In: Lecture Notes in Electrical Engineering; Digital Transformation in Semiconductor Manufacturing,
 
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3

Contributors:

, In: Genetically Modified Organisms in Food,
Aerni, Philipp ; Al-Turki, A.I. ; Amaral, Joana S.... - p. xv-xviii , 2016
 
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5

Are you really angry? : detecting emotion veracity as a ..:

, In: Proceedings of the 29th Australian Conference on Computer-Human Interaction,
Chen, Lu ; Gedeon, Tom ; Hossain, Md Zakir. - p. 412-416 , 2017
 
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