Anger, Sabrina
55  Ergebnisse:
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1

Combining Full Wafer Inspection with Deep Learning to Recog..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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2

Smart Platform for Rapid Prototyping: A First Solution Appr..:

, In: Lecture Notes in Electrical Engineering; Digital Transformation in Semiconductor Manufacturing,
 
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9

Dusky Langurs Trachypithecus obscurus (Reid, 1837)(Primates..:

Ang, Andie ; Jabbar, Sabrina ; Khoo, Max
Journal of Threatened Taxa.  12 (2020)  9 - p. 15967-15974 , 2020
 
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