Ich stimme zu, dass diese Seite Cookies verwende. Weitere Informationen finden Sie unter unseren Datenschutzerklärungen .
X
Olivo, Piero
107  Ergebnisse:
?
1

End-to-end modeling of variability-aware neural networks ba..:

, In: 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC),
Glukhov, Artem ; Lepri, Nicola ; Milo, Valerio... - p. 1-5 , 2022
Link: https://doi.org/10.1109/..
 
?
2

Experimental verification and benchmark of in-memory princi..:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),
Mannocci, Piergiulio ; Baroni, Andrea ; Melacarne, Enrico... - p. 326-330 , 2022
Link: https://doi.org/10.1109/..
 
?
3

In-Memory Principal Component Analysis by Crosspoint Array ..:

Mannocci, Piergiulio ; Baroni, Andrea ; Melacarne, Enrico...
IEEE Nanotechnology Magazine.  16 (2022)  2 - p. 4-13 , 2022
Link: https://doi.org/10.1109/..
 
?
4

Low Conductance State Drift Characterization and Mitigation..:

Baroni, Andrea ; Glukhov, Artem ; Perez, Eduardo...
IEEE Transactions on Device and Materials Reliability.  22 (2022)  3 - p. 340-347 , 2022
Link: https://doi.org/10.1109/..
 
?
5

An energy-efficient in-memory computing architecture for su..:

Baroni, Andrea ; Glukhov, Artem ; Pérez, Eduardo...
Frontiers in Neuroscience.  16 (2022)  - p. , 2022
Link: https://doi.org/10.3389/..
 
?
6

A Scalable Bidimensional Randomization Scheme for TLC 3D NA..:

Favalli, Michele ; Zambelli, Cristian ; Marelli, Alessia..
Micromachines.  12 (2021)  7 - p. 759 , 2021
Link: https://doi.org/10.3390/..
 
?
7

Assessing the Role of Program Suspend Operation in 3D NAND ..:

Zambelli, Cristian ; Zuolo, Lorenzo ; Aldarese, Antonio...
Electronics.  10 (2021)  12 - p. 1394 , 2021
Link: https://doi.org/10.3390/..
 
?
8

Points-Over-Threshold Statistics for Post-Retention Read Di..:

, In: 2020 IEEE International Integrated Reliability Workshop (IIRW),
Zambelli, Cristian ; Crippa, Luca ; Micheloni, Rino. - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
?
9

Mitigating Self-Heating in Solid State Drives for Industria..:

Zambelli, Cristian ; Zuolo, Lorenzo ; Crippa, Luca..
Electronics.  9 (2020)  7 - p. 1179 , 2020
Link: https://doi.org/10.3390/..
 
?
10

First Evidence of Temporary Read Errors in TLC 3D-NAND Flas..:

Zambelli, Cristian ; Micheloni, Rino ; Scommegna, Salvatrice.
IEEE Journal of the Electron Devices Society.  8 (2020)  - p. 99-104 , 2020
Link: https://doi.org/10.1109/..
 
?
11

Characterization of the interface-driven 1st Reset operatio..:

Pérez, Eduardo ; Mahadevaiah, Mamathamba Kalishettyhalli ; Zambelli, Cristian..
Solid-State Electronics.  159 (2019)  - p. 51-56 , 2019
Link: https://doi.org/10.1016/..
 
?
12

Dynamic VTH Tracking for Cross-Temperature Suppression in 3..:

, In: 2019 IEEE International Integrated Reliability Workshop (IIRW),
Zambelli, Cristian ; Ferro, Enrico ; Crippa, Luca.. - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
?
13

Toward Reliable Multi-Level Operation in RRAM Arrays: Impro..:

Perez, Eduardo ; Zambelli, Cristian ; Mahadevaiah, Mamathamba Kalishettyhalli..
IEEE Journal of the Electron Devices Society.  7 (2019)  - p. 740-747 , 2019
Link: https://doi.org/10.1109/..
 
?
14

LDPC Soft Decoding with Improved Performance in 1X-2X MLC a..:

Zuolo, Lorenzo ; Zambelli, Cristian ; Marelli, Alessia..
IEEE Transactions on Emerging Topics in Computing.  7 (2019)  3 - p. 507-515 , 2019
Link: https://doi.org/10.1109/..
 
?
15

An Automated Test Equipment for Characterization of Emergin..:

Grossi, Alessandro ; Zambelli, Cristian ; Olivo, Piero...
IEEE Transactions on Emerging Topics in Computing.  6 (2018)  2 - p. 269-277 , 2018
Link: https://doi.org/10.1109/..
 
1-15