Beckmann, Karsten
159  Ergebnisse:
?
7

Three Programming States in Bilayer Ga–Sb Phase Change Memo..:

Gong, Haibo ; Ume, Rubab ; Tokranov, Vadim...
IEEE Transactions on Electron Devices.  70 (2023)  7 - p. 3511-3516 , 2023
 
?
9

Investigating Device Degradation and Revival in Resistive R..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
 
?
10

Effect of Resistance variability in Vector Matrix Multiplic..:

, In: 2023 IEEE 32nd Microelectronics Design & Test Symposium (MDTS),
 
?
11

Analog NVM Synapse for Hardware-Aware Neural Network Traini..:

, In: 2023 IEEE 32nd Microelectronics Design & Test Symposium (MDTS),
 
?
12

Flow-Based Computing of NOR Logic Using ReRAM Devices:

, In: 2023 IEEE 32nd Microelectronics Design & Test Symposium (MDTS),
 
?
13

Failure Analysis of 65nm CMOS Integrated Nanoscale ReRAM De..:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),
 
?
15

Detecting Temporal Correlation on HfO2 Based RRAM on 65nm C..:

, In: 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS),
 
1-15