E-LIB Suche - Ergebnisse für: Erdmann, Andreas A.

1

Modelling nanomechanical effects in advanced lithographic m..:

D'Silva, Sean , 2023

Link: https://nbn-resolving.de..

2

Biomarkers of Neutrophil Activation in Patients with Sympto..:

Buso, Giacomo ; Faggin, Elisabetta ; Bressan, Alessandro...
Biomedicines. 11 (2023) 3 - p. 866 , 2023

Link: https://doi.org/10.3390/..

3

Modeling and Simulation Approaches for Material Challenges ..:

Belete, Zelalem Tamrate , 2022

Link: https://nbn-resolving.de..

4

Untersuchungen zu deterministischem und stochastischem Stre..:

Heusinger, Martin , [2019?]

Link: https://nbn-resolving.de..

5

Process modeling of two-photon and grayscale laser direct-w..:

Onanuga, Temitope , 2019

Link: https://nbn-resolving.de..

6

Learned sensing: jointly optimized microscope hardware for ..:

Muthumbi, Alex ; Chaware, Amey ; Kim, Kanghyun...
Biomedical Optics Express. 10 (2019) 12 - p. 6351 , 2019

Link: https://doi.org/10.1364/..

7

Tumeur dans le médiastin antérieur, bicytopénie, agammaglob..:

Pron, Maria Laura ; Stadlmann, Sylvia ; Gtschi, Stefan..
Forum Médical Suisse ‒ Swiss Medical Forum. , 2019

Link: https://doi.org/10.4414/..

8

Tumor im vorderen Mediastinum, Bizytopenie, Agammaglobulinä..:

Pron, Maria Laura ; Stadlmann, Sylvia ; Gtschi, Stefan..
Swiss Medical Forum ‒ Schweizerisches Medizin-Forum. , 2019

Link: https://doi.org/10.4414/..

9

Inverse Image Modeling for Defect Detection and Optical Sys..:

Xu, Dongbo , 2016

Link: http://nbn-resolving.de/..

10

Optical and EUV projection lithography: A computational vie:

Erdmann, Andreas ; Fühner, Tim ; Evanschitzky, Peter...
Microelectronic Engineering. 132 (2015) - p. 21-34 , 2015

Link: https://doi.org/10.1016/..

11

Aberration measurement technique based on an analytical lin..:

Yan, Guanyong ; Wang, Xiangzhao ; Li, Sikun...
Optics Express. 22 (2014) 5 - p. 5623 , 2014

Link: https://doi.org/10.1364/..

12

Advances in lithography: introduction to the feature:

Erdmann, Andreas ; Liang, Rongguang ; Sezginer, Apo.
Applied Optics. 53 (2014) 34 - p. LI1 , 2014

Link: https://doi.org/10.1364/..

13

Pixel-based defect detection from high-NA optical projectio..:

Xu, Dongbo ; Fühner, Tim ; Erdmann, Andreas
Applied Optics. 53 (2014) 18 - p. 3866 , 2014

Link: https://doi.org/10.1364/..

14

Advances in lithography: introduction to the feature:

Erdmann, Andreas ; Liang, Rongguang ; Sezginer, Apo.
Journal of the Optical Society of America A. 31 (2014) 12 - p. LI1 , 2014

Link: https://doi.org/10.1364/..

15

Adaptive denoising method to improve aberration measurement..:

Yang, Jishuo ; Wang, Xiangzhao ; Li, Sikun...
Optics Communications. 308 (2013) - p. 228-236 , 2013

Link: https://doi.org/10.1016/..