Smet, Vanessa
48  Ergebnisse:
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1

A Study of Chip-Package Interaction with All-Copper Interco..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
 
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2

Bayesian Optimization of Large Glass Package Architecture f..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
 
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3

Mitigating Cracking from RDL Stress in Glass Substrates wit..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
 
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4

Vanadium-Dioxide-Based Reconfigurable Ka-Band Dual-Sense Li..:

Lust, Mark S. ; West, David L. ; Smet, Vanessa..
IEEE Transactions on Antennas and Propagation.  72 (2024)  3 - p. 2468-2480 , 2024
 
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5

Impact of Non-Coplanarities on Microstructure and Propertie..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Amirnasiri, Ali ; Sosa, Ramon A. ; Tian, Mengkun.. - p. 2298-2303 , 2024
 
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6

Enabling Socketable BGAs with Eutectic-Forming Bi-based Coa..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Lee, Jaewon ; Smet, Vanessa - p. 1137-1143 , 2024
 
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7

Magneto-Assisted Graphene Reinforcement: A New Method to En..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
 
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8

A Multi-Objective, Machine-Learning-Based Optimization Meth..:

, In: 2023 IEEE Transportation Electrification Conference & Expo (ITEC),
 
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9

Intelligent Multi-Physics Design of 3-D Leadframe- based Si..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
 
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11

High Performance, Multilayer Copper-Graphene Micro-Foam Wic..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
Moss, Alex ; Antoniou, Antonia ; Smet, Vanessa - p. 2087-2092 , 2023
 
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12

Reliability and Failure Analysis of Chip-to-Substrate Cu-Pi..:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
 
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13

Demonstration of Glass-based 3D Package Architectures with ..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
 
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14

Compact SiC Power Module With Integrated Power Delivery and..:

Muslu, Ahmet Mete ; Smet, Vanessa ; Joshi, Yogendra
IEEE Transactions on Components, Packaging and Manufacturing Technology.  12 (2022)  12 - p. 1939-1948 , 2022
 
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15

Modeling and Design for System-Level Reliability and Warpag..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
Jayaram, Vidya ; Gupte, Omkar ; Smet, Vanessa - p. 1060-1067 , 2022
 
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