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X
Anger, Sabrina
4  Ergebnisse:
Buchkapitel (Online) X
Personensuche X
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1

Combining Full Wafer Inspection with Deep Learning to Recog..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Anger, Sabrina ; Yayak, Anil Bora ; Roeder, Georg... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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2

Smart Platform for Rapid Prototyping: A First Solution Appr..:

, In: Lecture Notes in Electrical Engineering; Digital Transformation in Semiconductor Manufacturing,
Schellenberger, Martin ; Anger, Sabrina ; Pfeffer, Markus... - p. 129-135 , 2020
Link: https://doi.org/10.1007/..
 
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3

Contributors:

, In: Genetically Modified Organisms in Food,
Aerni, Philipp ; Al-Turki, A.I. ; Amaral, Joana S.... - p. xv-xviii , 2016
Link: https://doi.org/10.1016/..
 
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4

The European Union Reference Methods Database and Decision ..:

, In: Genetically Modified Organisms in Food,
Bonfini, Laura ; Angers-Loustau, Alexandre ; Petrillo, Mauro... - p. 275-288 , 2016
Link: https://doi.org/10.1016/..
 
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