Oh, Joo Suk
93  Ergebnisse:
Personensuche X
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1

Contributors:

, In: Deep Learning for Medical Image Analysis,
Bian, Cheng ; Burt, Alastair D. ; Cao, Xiaohuan... - p. xv-xxii , 2024
 
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2

Ultrasonic Based Outdoor Localization Using Threshold Cross..:

, In: 2024 International Conference on Artificial Intelligence in Information and Communication (ICAIIC),
Lim, JaeJun ; Joo, Jaehan ; Kim, Suk Chan - p. 117-119 , 2024
 
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3

Double Deep Q-Learning based Backhaul Spectrum Allocation i..:

, In: 2023 International Conference on Artificial Intelligence in Information and Communication (ICAIIC),
Park, Jeonghun ; Jin, Heetae ; Joo, Jaehan.. - p. 706-708 , 2023
 
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4

ASIL-D Compliant Battery Monitoring IC with High Measuremen..:

, In: 2023 IEEE International Solid- State Circuits Conference (ISSCC),
Lee, Jong-Kyoung ; Woo, Sunsik ; Jeong, Wooyoung... - p. 322-324 , 2023
 
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5

First demonstration of 3-dimensional stacked FET with top/b..:

, In: 2023 International Electron Devices Meeting (IEDM),
Park, Jaehyun ; Kim, Wukang ; Park, Sungil... - p. 1-4 , 2023
 
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7

ConfZNS : A Novel Emulator for Exploring Design Space of ZN..:

, In: Proceedings of the 16th ACM International Conference on Systems and Storage,
Song, Inho ; Oh, Myounghoon ; Kim, Bryan Suk Joon... - p. 71-82 , 2023
 
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8

Age-Aware Guidance via Masking-Based Attention in Face Agin:

, In: Proceedings of the 32nd ACM International Conference on Information and Knowledge Management,
Maeng, Junyeong ; Oh, Kwanseok ; Suk, Heung-Il - p. 4165-4169 , 2023
 
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9

Frequency Mixup Manipulation Based Unsupervised Domain Adap..:

, In: Lecture Notes in Computer Science; Pattern Recognition,
Shin, Yooseung ; Maeng, Junyeong ; Oh, Kwanseok. - p. 123-135 , 2023
 
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10

A Semiconductor Open Failure Analysis Assisted by Scanning ..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Tae, Yong-Gyoung ; An, Ha-Young ; Jin, Justin.. - p. 1-4 , 2023
 
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11

GAN-based Image-to-Image Translation of Fundus Photography:..:

, In: 2023 Fourteenth International Conference on Ubiquitous and Future Networks (ICUFN),
Joo, Jaehan ; Seo, Jeongbin ; Choi, Geonho. - p. 746-748 , 2023
 
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12

Statistical Reliability Modeling and Analysis for Repairabl..:

, In: Springer Series in Reliability Engineering; Advances in Reliability and Maintainability Methods and Engineering Applications,
Bae, Suk Joo ; Mun, Byeong Min ; Kvam, Paul H. - p. 155-178 , 2023
 
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13

General Local Graph Attention in Large-scale Point Cloud Se..:

, In: 2023 IEEE International Conference on Consumer Electronics (ICCE),
 
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14

Wavelength – Tunable Grating – Resonance InGaAs Narrowband ..:

, In: 2023 International Electron Devices Meeting (IEDM),
Jang, Junho ; Kang, Il-Suk ; Oh, Yeon-Wha... - p. 1-4 , 2023
 
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15

Development of data labeling techniques for terahertz image..:

, In: 2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz),
 
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