Woo, Henry H
117  Ergebnisse:
Personensuche X
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1

17.3 A Fully Wireless, Miniaturized, Multicolor Fluorescenc..:

, In: 2024 IEEE International Solid-State Circuits Conference (ISSCC),
Rabbani, Rozhan ; Roschelle, Micah ; Gweon, Surin... - p. 318-320 , 2024
 
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2

Dataset, Noise Analysis, and Automated Parameter Estimation..:

, In: Proceedings of the 2024 ACM Workshop on Information Hiding and Multimedia Security,
 
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3

List of contributors:

, In: Handbook of Nanomaterials, Volume 1,
Abdullah, Mahmood M.S. ; Ahmad, Raice ; Ahmad, Zubair... - p. xxi-xxviii , 2024
 
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5

Contributors:

, In: Handbook of Food Powders,
Adhikari, Benu ; Badin, R. ; Barringer, Sheryl A.... - p. xv-xvi , 2024
 
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7

Enhancing Gesture Recognition for Musical Conducting: A Stu..:

, In: 2023 IEEE Symposium Series on Computational Intelligence (SSCI),
Woo, Gideon ; Tan, Faith ; Tsang, Herbert H. - p. 677-682 , 2023
 
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8

Highly Manufacturable, Cost-Effective, and Monolithically S..:

, In: 2023 International Electron Devices Meeting (IEDM),
Ha, Daewon ; Lee, Wonsok ; Cho, M.H.... - p. 1-4 , 2023
 
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9

List of Contributors:

, In: Diffusion MRI of the Breast,
 
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10

Reliability Characterization of HBM featuring $\text{HK}+\t..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Ha, Sungmock ; Lee, S. ; Bae, GH.... - p. 1-7 , 2023
 
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11

Psychological Aspects, Psychodermatology, and Vaccine Hesit..:

, In: COVID-19 in Dermatology; Updates in Clinical Dermatology,
 
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12

Interlayer Engineering to Achieve 2K/GW Thermal Boundary Re..:

, In: 2023 International Electron Devices Meeting (IEDM),
Woo, K. ; Malakoutian, M. ; Jo, Y.... - p. 1-4 , 2023
 
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13

Reliability Improvement with Optimized BEOL Process in Adva..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Lee, J.H. ; Woo, B.W. ; Lee, Y.M.... - p. 1-4 , 2023
 
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14

<1ppm Device to Chip Level Reliability Characterization for..:

, In: 2023 International Electron Devices Meeting (IEDM),
Lee, N-H ; Lee, S. ; Kim, G J.... - p. 1-4 , 2023
 
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15

First Stacked Nanosheet FeFET Featuring Memory Window of 1...:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Chen, Yu-Rui ; Liu, Yi-Chun ; Zhao, Zefu... - p. 1-2 , 2023
 
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