E-LIB Suche - Ergebnisse für: A'ain, Abu Khari

1

CNTFET based Voltage Mode MISO Active only Biquadratic Filt..:

Masud, Muhammad I. ; A'ain, Abu Khari Bin ; Khan, Iqbal A..
Circuits, Systems, and Signal Processing. 40 (2021) 10 - p. 4721-4740 , 2021

Link: https://doi.org/10.1007/..

2

A comparative analysis of LFSR cascading for hardware effic..:

, In: 2020 IEEE 29th Asian Test Symposium (ATS),

Alamgir, Arbab ; A'ain, Abu Khari Bin ; Paraman, Norlina.. - p. 1-5 , 2020

Link: https://doi.org/10.1109/..

3

Adaptive random testing with total cartesian distance for b..:

Alamgir, Arbab ; Khari A'ain, Abu ; Paraman, Norlina.
Indonesian Journal of Electrical Engineering and Computer Science. 20 (2020) 2 - p. 720 , 2020

Link: https://doi.org/10.11591..

4

Adaptive random testing with total cartesian distance for b..:

Alamgir, Arbab ; A'ain, Abu Khari ; Paraman, Norlina.
https://zenodo.org/record/7052278. , 2020

Link: https://zenodo.org/recor..

5

Adaptive random testing with total cartesian distance for b..:

Alamgir, Arbab ; Khari A'ain, Abu ; Paraman, Norlina.
https://ijeecs.iaescore.com/index.php/IJEECS/article/view/21904/14269. , 2020

Link: https://ijeecs.iaescore...

6

Multiple Controlled Antirandom Testing (MCAT) for High Faul..:

Alamgir, Arbab ; Khari Bin A'Ain, Abu ; Sheikh, Usman Ullah...
IEEE Access. 7 (2019) - p. 117246-117257 , 2019

Link: https://doi.org/10.1109/..

7

Design of Voltage Mode Electronically Tunable First Order A..:

Masud, Muhammad ; A'ain, Abu ; Khan, Iqbal.
Electronics. 8 (2019) 1 - p. 95 , 2019

Link: https://doi.org/10.3390/..

8

Multiple Controlled Antirandom Testing (MCAT) for High Faul..:

Arbab Alamgir ; Abu Khari Bin A'Ain ; Usman Ullah Sheikh...
https://ieeexplore.ieee.org/document/8811467/. , 2019

Link: https://doi.org/10.1109/..

9

Multiple controlled antirandom testing (MCAT) for high faul..:

Alamgir, Arbab ; Bin A'ain, Abu Khari ; Sheikh, Usman Ullah...
IEEE Access;7, pp. 117246-117257. , 2019

Link: http://hdl.handle.net/10..

10

Multiple controlled antirandom testing (MCAT) for high faul..:

Arbab Alamgir ; Abu Khari Bin A'ain ; Usman Ullah Sheikh...
10344/8217. , 2019

Link: https://figshare.com/art..

11

Horizontal diversity in test generation for high fault cove..:

Arbab Alamgir ; Abu Khari Bin A'ain ; Norlina Paraman..
10344/7465. , 2018

Link: https://figshare.com/art..

12

Rail-to-rail op-amp design incorporating negative miller an..:

Muhaned Ali Hussein Zaidi ; IAN GROUT ; Abu Khari A'ain
10344/6668. , 2018

Link: https://figshare.com/art..

13

Rail-to-rail op-amp design incorporating negative miller an..:

Zaidi, Muhaned Ali Hussein ; Grout, Ian ; A'ain, Abu Khari
International Journal of Science and Engineering Investigations;7 (73), pp. 26-36. , 2018

Link: http://hdl.handle.net/10..

14

Horizontal diversity in test generation for high fault cove..:

Alamgir, Arbab ; Bin A'ain, Abu Khari ; Paraman, Norlina..
Turkish Journal of Electrical Engineering & Computer Sciences;26, pp. 3258-3273. , 2018

Link: http://hdl.handle.net/10..

15

RGB LED Driver Circuit Design for an Optical Fiber Sensor S..:

Grout, Ian A. ; Zaidi, Muhaned ; Sterckx, Karel L..
ECTI Transactions on Computer and Information Technology (ECTI-CIT). 11 (2017) 2 - p. 163-177 , 2017

Link: https://doi.org/10.37936..