Bockisch, A.
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MMT: Mutation Testing of Java Bytecode with Model Transform..:

, In: 2023 ACM/IEEE International Conference on Model Driven Engineering Languages and Systems Companion (MODELS-C),
 
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Domain TILEs: Test Informed Learning with Examples from the..:

, In: Lecture Notes in Business Information Processing; Research Challenges in Information Science: Information Science and the Connected World,
Doorn, Niels ; Vos, Tanja ; Marín, Beatriz... - p. 501-508 , 2023
 
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