Daus, Alwin
71  Ergebnisse:
Personensuche X
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8

Effect of Back-Gate Dielectric on Indium Tin Oxide (ITO) Tr..:

Daus, Alwin ; Hoang, Lauren ; Gilardi, Carlo...
IEEE Transactions on Electron Devices.  70 (2023)  11 - p. 5685-5689 , 2023
 
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9

Low-temperature MoS2 growth on CMOS wafers:

Lemme, Max C. ; Daus, Alwin
Nature Nanotechnology.  18 (2023)  5 - p. 446-447 , 2023
 
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10

Efficiency Limit of Transition Metal Dichalcogenide Solar C..:

, In: 2023 IEEE 50th Photovoltaic Specialists Conference (PVSC),
 
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13

Effect of Top-Gate Dielectric Deposition on the Performance..:

Wahid, Sumaiya ; Daus, Alwin ; Kwon, Jimin...
IEEE Electron Device Letters.  44 (2023)  6 - p. 951-954 , 2023
 
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14

Performance Limits of Transition Metal Dichalcogenide Solar..:

, In: 2023 Middle East and North Africa Solar Conference (MENA-SC),
 
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