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2023 18th European Microwave Integrated Circuits Conference (EuMIC) ,
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Capacitance RF Characterization and Modeling of 28 FD-SOI C..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
4
Insight Into HCI Reliability on I/O Nitrided Devices:
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2023 International Electron Devices Meeting (IEDM) ,
6
3D sequential integration with Si CMOS stacked on 28nm indu..:
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2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
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