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2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) ,
2
CMOS Scaling by Nanosheet Device Architectures and Backside..:
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2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
4
Forksheet Field-Effect Transistors for Area Scaling and Gat..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
6
Side and Corner Region Non-Uniformities in Grown SiO2 and T..:
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2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
7