Hugh, Thomas J.
5121  Ergebnisse:
Personensuche X
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Neutron Displacement Damage in Bipolar Junction Transistors..:

Young, Joshua M. ; Banerjee, Sneha ; Ho, Le Thanh Triet...
IEEE Transactions on Nuclear Science.  71 (2024)  4 - p. 569-578 , 2024
 
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Textural evidence of fragmentation and densification proces..:

Rojas, Flavia ; Browning, John ; Tuffen, Hugh...
Journal of Volcanology and Geothermal Research.  447 (2024)  - p. 108028 , 2024
 
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7

Using different transport modes: An opportunity to reduce U..:

Thomas, Hugh ; Serrenho, André Cabrera
Transportation Research Part D: Transport and Environment.  126 (2024)  - p. 103989 , 2024
 
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