E-LIB Suche - Ergebnisse für: Jiruse, Jaroslav

1

A New Fully Integrated Retractable 4D STEM Detector for Sca..:

Motúz, Rastislav ; Jiruše, Jaroslav ; Stejskal, Pavel..
Microscopy and Microanalysis. 30 (2024) Supplement_1 - p. , 2024

Link: https://doi.org/10.1093/..

2

Correlative Microscopy of Nanophotonic Materials:

Horák, Michal ; Liška, Petr ; Kepič, Peter...
Microscopy and Microanalysis. 30 (2024) Supplement_1 - p. , 2024

Link: https://doi.org/10.1093/..

3

An Optimized In-column Detection System for the Ultra-high ..:

Jiruše, Jaroslav ; Sytař, Petr ; Páral, Jan.
Microscopy and Microanalysis. 26 (2020) S2 - p. 1806-1807 , 2020

Link: https://doi.org/10.1017/..

4

A New Generation Plasma FIB Column with Higher Probe Curren..:

Hrnčíř, Tomáš ; Nešpor, Dušan ; Radi, Zsolt...
Microscopy and Microanalysis. 26 (2020) S2 - p. 412-413 , 2020

Link: https://doi.org/10.1017/..

5

TESCAN Approaches to Biological Field Emission Scanning Ele..:

, In: Biological Field Emission Scanning Electron Microscopy,

Jiruše, Jaroslav ; Košťál, Vratislav ; Lencová, Bohumila - p. 79-101 , 2019

Link: https://doi.org/10.1002/..

6

Detection Systems of Ultra-High-Resolution SEMs:

Jiruse, Jaroslav ; Havelka, Miloslav ; Polster, Jan...
Microscopy and Microanalysis. 24 (2018) S1 - p. 606-607 , 2018

Link: https://doi.org/10.1017/..

7

S9000X - Next Generation of Ultra-High Resolution SEM for E..:

Havelka, Miloslav ; Jiruse, Jaroslav ; Hrncif, Tomas...
Microscopy and Microanalysis. 24 (2018) S1 - p. 1116-1117 , 2018

Link: https://doi.org/10.1017/..

8

A Detection System with Controlled Surface Sensitivity for ..:

Sytaf, Petr ; Jiruse, Jaroslav ; Paral, Jan
Microscopy and Microanalysis. 23 (2017) S1 - p. 24-25 , 2017

Link: https://doi.org/10.1017/..

9

A New SEM Column Combining Ultra-High Resolution and Flexib..:

Sytaf, Petr ; Jiruse, Jaroslav ; Zavodny, Adam
Microscopy and Microanalysis. 23 (2017) S1 - p. 38-39 , 2017

Link: https://doi.org/10.1017/..

10

Design of an Ultra-High Resolution SEM for Enhanced Analysi:

Jiruse, Jaroslav ; Havelka, Miloslav ; Polster, Jan
Microscopy and Microanalysis. 22 (2016) S3 - p. 578-579 , 2016

Link: https://doi.org/10.1017/..

11

On the Calculation of SEM and FIB Beam Profiles:

Kološová, Jolana ; Hrnčíř, Tomáš ; Jiruše, Jaroslav..
Microscopy and Microanalysis. 21 (2015) S4 - p. 206-211 , 2015

Link: https://doi.org/10.1017/..

12

New High-Resolution Low-Voltage and High Performance Analyt..:

Jiruše, Jaroslav ; Havelka, Miloslav ; Haničinec, Martin..
Microscopy and Microanalysis. 20 (2014) S3 - p. 1104-1105 , 2014

Link: https://doi.org/10.1017/..

13

Novel Cathodoluminescence Detector with Extremely Large Fie..:

Kološová, Jolana ; Jiruše, Jaroslav
Microscopy and Microanalysis. 20 (2014) S3 - p. 912-913 , 2014

Link: https://doi.org/10.1017/..

14

FIB-SEM Instrument with Integrated Raman Spectroscopy for C..:

Jiruse, Jaroslav ; Hanicinec, Martin ; Havelka, Miloslav...
Microscopy and Microanalysis. 20 (2014) S3 - p. 990-991 , 2014

Link: https://doi.org/10.1017/..

15

Novel field emission SEM column with beam deceleration tech..:

Jiruše, Jaroslav ; Havelka, Miloslav ; Lopour, Filip
Ultramicroscopy. 146 (2014) - p. 27-32 , 2014

Link: https://doi.org/10.1016/..