O'Sullivan, B
5059  Ergebnisse:
Personensuche X
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2

Side and Corner Region Non-Uniformities in Grown SiO2 and T..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Bastos, J. P. ; O'Sullivan, B. J. ; Higashi, Y.... - p. P36.PI-1-P36.PI-7 , 2024
 
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10

Performance Comparison Between All-Pass and IQ Optical Modu..:

Saxena, B. ; Farley, K. ; Reimer, M. A....
Journal of Lightwave Technology.  42 (2024)  1 - p. 201-207 , 2024
 
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11

DC Reliability Study of $\text{high}-\kappa$ GaN-on-Si MOS-..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
 
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