Pappalardo, Alberto
264  Ergebnisse:
Personensuche X
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SAFFIRA: a Framework for Assessing the Reliability of Systo..:

, In: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS),
Taheri, Mahdi ; Daneshtalab, Masoud ; Raik, Jaan... - p. 19-24 , 2024
 
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Approximate Fault-Tolerant Neural Network Systems:

, In: 2024 IEEE European Test Symposium (ETS),
 
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12

Contributors:

, In: Principles of Human Organs-on-Chips,
 
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Resilience-Performance Tradeoff Analysis of a Deep Neural N..:

, In: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS),
 
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