Phulpin, Tanguy
147  Ergebnisse:
Personensuche X
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1

Experimental Study of a Three-Phase Diode Rectifier Operati..:

Baazizi, Yasmine ; Ferreira, Lauro ; Meunier, Simon..
IEEE Transactions on Applied Superconductivity.  34 (2024)  3 - p. 1-5 , 2024
 
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7

SiC MOSFET micro-explosion due to a single event burnout: a..:

Germanicus, Rosine Coq ; Phulpin, Tanguy ; Rogaume, Thomas...
info:eu-repo/semantics/altIdentifier/doi/10.31399/asm.cp.istfa2023p0483.  , 2023
 
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14

SiC MOSFET micro-explosion due to a single event burnout: a..:

Germanicus, Rosine Coq ; Phulpin, Tanguy ; Rogaume, Thomas...
info:eu-repo/semantics/altIdentifier/doi/10.31399/asm.cp.istfa2023p0483.  , 2023
 
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15

SiC MOSFET micro-explosion due to a single event burnout: a..:

Germanicus, Rosine Coq ; Phulpin, Tanguy ; Rogaume, Thomas...
info:eu-repo/semantics/altIdentifier/doi/10.31399/asm.cp.istfa2023p0483.  , 2023
 
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