Snead, L.
2335  Ergebnisse:
Personensuche X
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4

In-Situ Post Etch Fluorocarbon Byproduct Removal for HDP Vo..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Bharatan, Prabhakar ; Ye, Jeff J. ; Webb, Brad... - p. 1-5 , 2024
 
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6

Synchrotron based investigation of anisotropy and microstru..:

Robin, Ishtiaque K. ; Sprouster, David J. ; Sridharan, Niyanth..
Journal of Materials Research and Technology.  29 (2024)  - p. 5010-5021 , 2024
 
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An Application of Judgement Modeling to Examine Inter-Cultu..:

zhou, fuzhao ; Snead, Ken C. ; Kraft, Margo J....
International Journal of Business and Social Science Research.  , 2024
 
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