Tokunaga, Carlos
41  Ergebnisse:
Personensuche X
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2

Measurement of Aging Effect in a Digitally Controlled Induc..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
 
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4

An Eight-Core RISC-V Processor With Compute Near Last Level..:

Chen, Gregory K. ; Knag, Phil C. ; Tokunaga, Carlos.
IEEE Journal of Solid-State Circuits.  58 (2023)  4 - p. 1117-1128 , 2023
 
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5

15.5 A 100Gbps Fault-Injection Attack Resistant AES-256 Eng..:

, In: 2023 IEEE International Solid- State Circuits Conference (ISSCC),
 
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7

A microRNA signature for risk-stratification and response p..:

Okuno, Keisuke ; Kandimalla, Raju ; Mendiola, Marta...
https://molecular-cancer.biomedcentral.com/articles/10.1186/s12943-022-01699-2.  , 2023
 
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9

Improving compute in-memory ECC reliability with successive..:

, In: Proceedings of the 59th ACM/IEEE Design Automation Conference,
Crafton, Brian ; Wan, Zishen ; Spetalnick, Samuel... - p. 745-750 , 2022
 
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11

Analysis of the Effect of Hot Carrier Injection in An Integ..:

, In: Proceedings of the ACM/IEEE International Symposium on Low Power Electronics and Design,
 
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12

An 8-core RISC-V Processor with Compute near Last Level Cac..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
 
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14

A Back-Sampling Chain Technique for Accelerated Detection, ..:

Kumar, Saurabh ; Cho, Minki ; Everson, Luke R....
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  29 (2021)  12 - p. 2086-2097 , 2021
 
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15

Linear probing of molecules at micrometric distances from a..:

Lukusa Mudiayi, Junior ; Maurin, Isabelle ; Mashimo, Taro...
info:eu-repo/semantics/altIdentifier/doi/10.1103/PhysRevLett.127.043201.  , 2021
 
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