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2024 IEEE International Reliability Physics Symposium (IRPS) ,
2
Measurement of Aging Effect in a Digitally Controlled Induc..:
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2023 IEEE International Solid- State Circuits Conference (ISSCC) ,
5
15.5 A 100Gbps Fault-Injection Attack Resistant AES-256 Eng..:
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Proceedings of the 59th ACM/IEEE Design Automation Conference ,
9
Improving compute in-memory ECC reliability with successive..:
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Proceedings of the ACM/IEEE International Symposium on Low Power Electronics and Design ,
11
Analysis of the Effect of Hot Carrier Injection in An Integ..:
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2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
12