Nellist, P D
159  Ergebnisse:
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3

Combine 4D STEM and EELS Using a Fast Pixelated Direct Dete..:

Huth, M ; Eckert, B ; Aschauer, S...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 401-402 , 2023
 
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4

A direct method for Fourier ptychography:

Clark, L. ; Paganin, D. M. ; Zhao, J....
Acta Crystallographica Section A Foundations and Advances.  79 (2023)  a2 - p. C308-C308 , 2023
 
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5

Quantification of 3D atomic structures and their dynamics f..:

Van Aert, S. ; De Backer, A. ; Irmak, E. Arslan...
Acta Crystallographica Section A Foundations and Advances.  79 (2023)  a2 - p. C310-C310 , 2023
 
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8

Aberration-corrected scanning transmission electron microsc..:

Pennycook, S. J. ; Lupini, A. R. ; Kadavanich, A....
International Journal of Materials Research.  94 (2022)  4 - p. 350-357 , 2022
 
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11

Applications of Low Dose Electron Ptychography:

Kirkland, AI ; Kim, J S ; Allen, C S...
Microscopy and Microanalysis.  28 (2022)  S1 - p. 352-354 , 2022
 
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12

Quantitative electron ptychography for simultaneous light a..:

Liberti, Emanuela ; Moya, Arthur N. ; Treder, Kevin P....
Acta Crystallographica Section A Foundations and Advances.  77 (2021)  a2 - p. C235-C235 , 2021
 
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15

Exploring the Limits of Focused-Probe STEM Ptychography:

Nellist, P. D. ; Martinez, G. T. ; O'Leary, C..
Microscopy and Microanalysis.  24 (2018)  S1 - p. 190-191 , 2018
 
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