Shi, Shan-Rui
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Performance assessment of run-to-run control in semiconduct..:

, In: International journal of production research / Institution of Production Engineers ; American Institute of Industrial Engineers ; Society of Manufacturing Engineers
Jang, Shi-shang ; Wang, David Shan-hill ; Chen, Liang.. (2009)  15 - p. 4173-4199
Exemplare: Zentrale;
 
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