Bong, Hyeon-Cheol
27  Ergebnisse:
Personensuche X
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1

The Changing Landscape of Action Learning Practice in South..:

, In: Human Resource Development in South Korea,
Bong, Hyeon-Cheol ; Cho, Yonjoo - p. 219-234 , 2020
 
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2

Fea of Thermo-Mechanically Induced Cracks in IMD:

, In: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC),
 
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3

Real-time single-molecule co-immunoprecipitation analyses r..:

, In: 2015 11th Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR),
Lee, Hong-Won ; Kyung, Taeyoon ; Yoo, Janghyun... - p. 1-2 , 2015
 
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4

2.4 ATOMUS: A 5nm 32TFLOPS/128TOPS ML System-on-Chip for La..:

, In: 2024 IEEE International Solid-State Circuits Conference (ISSCC),
Yu, Chang-Hyo ; Kim, Hyo-Eun ; Shin, Sungho... - p. 42-44 , 2024
 
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5

Differentiated assignment of extrinsic information in itera..:

, In: 2016 18th International Conference on Advanced Communication Technology (ICACT),
Bong, Wonsung ; Kim, Yong Cheol - p. 1-1 , 2016
 
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6

Reconstruction of radio map from sparse RSS data by discont..:

, In: Proceedings of the 2012 ACM Research in Applied Computation Symposium,
Bong, Wonsun ; Kim, Yong Cheol - p. 227-231 , 2012
 
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8

Cryogenic RF Transistors and Routing Circuits Based on 3D S..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
 
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9

Impact of the channel thickness fluctuation on the subthres..:

, In: 2023 International Electron Devices Meeting (IEDM),
Jeong, Jaeyong ; Kim, Jongmin ; Lee, Jisung... - p. 1-4 , 2023
 
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10

Strategy for 3D Ferroelectric Transistor: Critical Surface ..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
 
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11

Thermal Management in Multi-Finger GaN-on-Si HEMTs: Underst..:

, In: 2023 International Electron Devices Meeting (IEDM),
 
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12

Fully CMOS-Compatible Room-Temperature Waveguide-Integrated..:

, In: 2023 International Electron Devices Meeting (IEDM),
Shim, Joonsup ; Lim, Jinha ; Kim, Inki... - p. 1-4 , 2023
 
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13

Proposal of P-Channel FE NAND with High Drain Current and F..:

, In: 2023 IEEE International Memory Workshop (IMW),
 
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14

IL Scavenging and Recovery Strategies to Improve the Perfor..:

, In: 2023 International Electron Devices Meeting (IEDM),
 
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15

Role of Inter-Layer Dielectric on the Electrical and Heat D..:

, In: 2023 International Electron Devices Meeting (IEDM),
 
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