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Chuang, Min-Hua
162  Ergebnisse:
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1

A pattern-based verification approach for a multi-core syst..:

, In: Proceedings of the 2011 ACM Symposium on Applied Computing,
Chu, Peng-Hua ; Hsueh, Nien-Lin ; Lee, Chien-Ching... - p. 49-53 , 2011
Link: https://dl.acm.org/doi/1..
 
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2

Hybrid Full-Bridge Phase-Shift and Half-Bridge LLC Resonant..:

, In: 2024 10th International Conference on Applied System Innovation (ICASI),
Hua, Chih-Chiang ; Chuang, Ching-Chun ; Hong, Min-Rui. - p. 262-264 , 2024
Link: https://doi.org/10.1109/..
 
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3

A Thru-Reflect-Series-Resistance (TRS) Calibration for Cryo..:

, In: 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023,
Chen, Yi-Ting ; Huang, Ian ; Lin, Min-Jui... - p. 1203-1206 , 2023
Link: https://doi.org/10.1109/..
 
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4

Chromirror : a real-time interactive mirror for chromati..:

, In: CHI '08 Extended Abstracts on Human Factors in Computing Systems,
Cheng, Chueh-Min ; Chung, Meng-Fang ; Yu, Ming-Yang... - p. 2787-2792 , 2008
Link: https://dl.acm.org/doi/1..
 
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5

Statistical Analysis of Intrinsic High-Frequency Characteri..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Kola, Sekhar Reddy ; Li, Yiming ; Chuang, Min-Hui.. - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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6

Characteristics Fluctuation of Sub-3-nm Bulk FinFET Devices..:

, In: 2023 IEEE 23rd International Conference on Nanotechnology (NANO),
Kola, Sekhar Reddy ; Chuang, Min-Hui ; Li, Yiming - p. 917-922 , 2023
Link: https://doi.org/10.1109/..
 
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7

Intrinsic Parameter Fluctuation and Process Variation Effec..:

, In: 2023 24th International Symposium on Quality Electronic Design (ISQED),
Kola, Sekhar Reddy ; Li, Yiming ; Chuang, Min-Hui - p. 1-8 , 2023
Link: https://doi.org/10.1109/..
 
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8

Application of Mobilenetv3 for Detecting Resin Overflow Def..:

, In: Advances in Networked-based Information Systems; Lecture Notes on Data Engineering and Communications Technologies,
Chang, Chuan-Yu ; Chuang, Min-Yen ; Su, You-Da. - p. 393-402 , 2023
Link: https://doi.org/10.1007/..
 
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9

5G Smart IoT Poles:

, In: 2022 International Conference on Wireless Communications Signal Processing and Networking (WiSPNET),
Tung, Yi-Chih ; Zhan, Zhi-Quan ; Chuang, Min-Hsu... - p. 153-157 , 2022
Link: https://doi.org/10.1109/..
 
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10

Statistical 3D Device Simulation of Full Fluctuations of Ga..:

, In: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Kola, Sekhar Reddy ; Li, Yiming ; Chen, Chieh-Yang. - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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11

Estimating the Process Variation Effects of Stacked Gate Al..:

, In: 2022 IEEE 22nd International Conference on Nanotechnology (NANO),
Butola, Rajat ; Li, Yiming ; Kola, Sekhar Reddy.. - p. 170-173 , 2022
Link: https://doi.org/10.1109/..
 
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12

A Unified Statistical Analysis of Comprehensive Fluctuation..:

, In: 2022 23rd International Symposium on Quality Electronic Design (ISQED),
Kola, Sekhar Reddy ; Li, Yiming ; Chen, Chieh-Yang. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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13

Numerical Simulation of Thermal Conductivity of Silicon Nan..:

, In: Scientific Computing in Electrical Engineering; Mathematics in Industry,
Chuang, Min-Hui ; Li, Yiming - p. 63-71 , 2021
Link: https://doi.org/10.1007/..
 
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14

Energy Band Calculation of Si/Si0.7 Ge0.3 Nanopillars in k➙..:

, In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Chuang, Min-Hui ; Li, Yiming - p. 23-26 , 2020
Link: https://doi.org/10.23919..
 
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15

Analysis of Negative Capacitance MOSFETs Characteristic wit..:

, In: 2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Lee, Yu-Chun ; Kola, Sekhar Reddy ; Chen, Chieh-Yang.. - p. 84-85 , 2020
Link: https://doi.org/10.1109/..
 
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