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Le, Tien-Duy B.
136  Ergebnisse:
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1

The Future Can't Help Fix The Past: Assessing Program Repai..:

, In: 2023 IEEE International Conference on Software Maintenance and Evolution (ICSME),
Kabadi, Vinay ; Kong, Dezhen ; Xie, Siyu... - p. 50-61 , 2023
Link: https://doi.org/10.1109/..
 
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2

DSM: a specification mining tool using recurrent neural net..:

, In: Proceedings of the 2018 26th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering,
Le, Tien-Duy B. ; Bao, Lingfeng ; Lo, David - p. 896-899 , 2018
Link: https://dl.acm.org/doi/1..
 
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3

Deep specification mining:

, In: Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis,
Le, Tien-Duy B. ; Lo, David - p. 106-117 , 2018
Link: https://dl.acm.org/doi/1..
 
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4

RCLinker : automated linking of issue reports and commit..:

, In: Proceedings of the 2015 IEEE 23rd International Conference on Program Comprehension,
Le, Tien-Duy B. ; Linares-Vásquez, Mario ; Lo, David. - p. 36-47 , 2015
Link: https://dl.acm.org/doi/1..
 
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5

Synergizing specification miners through model fissions and..:

, In: Proceedings of the 30th IEEE/ACM International Conference on Automated Software Engineering,
Le, Tien-Duy B. ; Le, Xuan-Bach D. ; Lo, David. - p. 115-125 , 2015
Link: https://dl.acm.org/doi/1..
 
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6

Information retrieval and spectrum based bug localization: ..:

, In: Proceedings of the 2015 10th Joint Meeting on Foundations of Software Engineering,
Le, Tien-Duy B. ; Oentaryo, Richard J. ; Lo, David - p. 579-590 , 2015
Link: https://dl.acm.org/doi/1..
 
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7

BugLocalizer: integrated tool support for bug localization:

, In: Proceedings of the 22nd ACM SIGSOFT International Symposium on Foundations of Software Engineering,
Thung, Ferdian ; Le, Tien-Duy B. ; Kochhar, Pavneet Singh. - p. 767-770 , 2014
Link: https://dl.acm.org/doi/1..
 
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8

It's not a bug, it's a feature: does misclassification affe..:

, In: Proceedings of the 11th Working Conference on Mining Software Repositories,
Kochhar, Pavneet Singh ; Le, Tien-Duy B. ; Lo, David - p. 296-299 , 2014
Link: https://dl.acm.org/doi/1..
 
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9

A learning-to-rank based fault localization approach using ..:

, In: Proceedings of the 25th International Symposium on Software Testing and Analysis,
B. Le, Tien-Duy ; Lo, David ; Le Goues, Claire. - p. 177-188 , 2016
Link: https://dl.acm.org/doi/1..
 
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10

DTA Hunter System : A new statistic-based framework of p..:

, In: Proceedings of the 8th International Symposium on Information and Communication Technology,
Phung, Duy V. ; Hoang, Tu M. ; Nguyen, Anh T.. - p. 159-166 , 2017
Link: https://dl.acm.org/doi/1..
 
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11

Optimal Design of Hedge-Algebras-Based Controller for Activ..:

, In: Advances in Information and Communication Technology; Lecture Notes in Networks and Systems,
Bui, Hai-Le ; Nguyen, Tien-Duy ; Le, Viet-Duc - p. 163-170 , 2024
Link: https://doi.org/10.1007/..
 
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12

Rice Growth Stage Monitoring and Yield Estimation in the Vi..:

, In: Remote Sensing of Agriculture and Land Cover/Land Use Changes in South and Southeast Asian Countries,
Hoang-Phi, Phung ; Lam-Dao, Nguyen ; Nguyen-Van-Anh, Vu... - p. 297-307 , 2022
Link: https://doi.org/10.1007/..
 
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13

Predicting Vietnamese Stock Market Using the Variants of LS..:

, In: Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering; Nature of Computation and Communication,
Truong, Cong-Doan ; Tran, Duc-Quynh ; Nguyen, Van-Dinh.. - p. 129-137 , 2021
Link: https://doi.org/10.1007/..
 
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14

Security Solution for the Internet of Things with the Innov..:

, In: Advances in Intelligent Systems and Computing; Advanced Computational Paradigms and Hybrid Intelligent Computing,
Van Tanh, Nguyen ; Tri, Ngo Quang ; Giang, Nguyen Linh. - p. 503-513 , 2021
Link: https://doi.org/10.1007/..
 
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15

On-Device Lightweight Transfer Learning for Automotive Intr..:

, In: 2024 IEEE 9th International Conference for Convergence in Technology (I2CT),
Vo, Dang-Duy-Tien ; Nguyen, Xuan-Bach ; Tran, Quang-Kiet. - p. 1-7 , 2024
Link: https://doi.org/10.1109/..
 
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