Perez-Cebolla, Francisco Jose
3  Ergebnisse:
Personensuche X
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Experimental verification of the AC resistance effect in In..:

, In: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe),
Aizpuru, Iosu ; Lajas, Miguel ; Arruti, Asier... - p. 1-8 , 2023
 
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Loss Measurement of Low RDS Devices Through Thermal Modelli..:

, In: 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe),
 
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Analysis of Li-ion battery degradation using self-organizin..:

, In: IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society,
 
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