Personensuche
X
?
2021 IEEE International Electron Devices Meeting (IEDM) ,
1
A $2.9\mu \mathrm{m}$ Pixel CMOS Image Sensor for Security ..:
, In:
?
Advances in High-Pressure Technology for Geophysical Applications ,
2
Simultaneous equation of state, pressure calibration and so..:
, In:
?
Advances in High-Pressure Techniques for Geophysical Applications ,
3
High-pressure angle-dispersive powder diffraction using an ..:
, In:
?
Advances in High-Pressure Techniques for Geophysical Applications ,
4
Stress and strain measurements of polycrystalline materials..:
, In:
?
Advances in High-Pressure Techniques for Geophysical Applications ,
5
Simultaneous equation of state, pressure calibration and so..:
, In:
?
Greenhouse Gas Control Technologies - 6th International Conference ,
6
Estimations of Interfacial Tensions Between Liquid CO2 and ..:
, In:
?
Technical Digest. CLEO/Pacific Rim'95. The Pacific Rim Conference on Lasers and Electro-Optics ,
7
Recent progress of liquid crystal displays:
, In:
?
2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) ,
9
Development of large area SOI pixel sensor "XRPIX-X" with p..:
, In:
?
2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) ,
10
Evaluation of methods for measuring the field of an intense..:
, In:
?
2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia) ,
11
A Hybrid Thermoelectric Generator – Battery Power Supply Sy..:
, In:
?
2022 IEEE International Interconnect Technology Conference (IITC) ,
12
Cryogenic CMOS Performance Analysis Including BEOL Characte..:
, In:
?
Lecture Notes in Mechanical Engineering; Advances in Condition Monitoring and Structural Health Monitoring ,
13
Three-Dimensional Reconstruction of Leaked Gas Cloud Image ..:
, In:
?
2020 IEEE International Symposium on Circuits and Systems (ISCAS) ,
14
A Wide Range and High Accuracy Sensor Interface with Switch..:
, In:
?
2019 IEEE International Electron Devices Meeting (IEDM) ,
15