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2010 International Conference on Computer Application and System Modeling (ICCASM 2010) ,
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Research on middleware technology for pervasive computing:
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2009 IEEE 22nd International Conference on Micro Electro Mechanical Systems ,
2
Surface Acoustic Wave-Driven Active Plasmonicsbased on Dyna..:
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2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) ,
3
A 4H-SiC Trench MOS Capacitor Structure for Sidewall Oxide ..:
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2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) ,
4
Triple Self-Aligned Split-Gate Architecture for High-Speed ..:
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2024 IEEE 42nd VLSI Test Symposium (VTS) ,
5
OpenROAD and CircuitOps: Infrastructure for ML EDA Research..:
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2023 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) ,
6
A Study on the Impact of Gamma Rays Irradiation on 4H-SiC C..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
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Investigation of Safe Operating Area on 4H-SiC 600V VDMOSFE..:
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2023 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) ,
8
Investigation of Positive Bias Temperature Instability of 4..:
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2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT) ,
9
Characterization of 4H-SiC PMOSFET with P+ Poly-Si Gate:
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2023 35th International Conference on Microelectronic Test Structure (ICMTS) ,
10
A multi-contact six-terminal cross-bridge Kelvin resistor (..:
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2022 ACM/IEEE 4th Workshop on Machine Learning for CAD (MLCAD) ,
11
SpeedER: A Supervised Encoder-Decoder Driven Engine for Eff..:
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2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
12
Device isolation process for 4H-SiC CMOS ICs:
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2022 International Electron Devices Meeting (IEDM) ,
13
Design and Characterization of the Junction Isolation Struc..:
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2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) ,
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An Evaluation for Quality Inspection of Epitaxial Layer and..:
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2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ,
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