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2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) ,
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Easily-Verifiable Design of Non-Scan Sequential Machines fo..:
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Advanced Techniques for IoT Applications; Lecture Notes in Networks and Systems ,
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Design of All Optical Binary Comparator:
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2020 IEEE 29th Asian Test Symposium (ATS) ,
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Heuristic Approach for Identification of Random TSV Defects..:
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2019 IEEE 28th Asian Test Symposium (ATS) ,
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Detailed Fault Model for Physical Quantum Circuits:
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Communications in Computer and Information Science; VLSI Design and Test ,
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Delay Efficient All Optical Carry Lookahead Adder:
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2015 IEEE 24th Asian Test Symposium (ATS) ,
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Design-for-testability in reversible logic circuits based o..:
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Proceedings of the 23rd ACM international conference on Great lakes symposium on VLSI ,
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