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2023 IEEE International Integrated Reliability Workshop (IIRW) ,
4
On-Chip Monitoring of Time-Dependent Dielectric Breakdown (..:
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2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS) ,
5
An Improved Single-Temperature Trim Technique for 1st Order..:
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2023 IEEE International Symposium on Circuits and Systems (ISCAS) ,
7
A Resistorless Precision Curvature-Compensated Bandgap Volt..:
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2023 IEEE International Symposium on Circuits and Systems (ISCAS) ,
9