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2023 IEEE International Reliability Physics Symposium (IRPS) ,
4
Effects of Collected Charge and Drain Area on SE Response o..:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
9
Soft Error Characterization of D-FFs at the 5-nm Bulk FinFE..:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
10