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Chaudhuri, Arjun
80  Ergebnisse:
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1

Design-for-Test Solutions for 3D Integrated Circuits*:

Hung, Shao-Chun ; Bhoumik, Partho ; Chaudhuri, Arjun..
Integrated Circuits and Systems.  , 2024
Link: https://doi.org/10.23919..
 
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2

Fault Diagnosis for Resistive Random Access Memory and Mono..:

Hung, Shao-Chun ; Chaudhuri, Arjun ; Banerjee, Sanmitra.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  32 (2024)  7 - p. 1336-1349 , 2024
Link: https://doi.org/10.1109/..
 
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3

TaintLock: Hardware IP Protection Against Oracle-Guided and..:

Talukdar, Jonti ; Chaudhuri, Arjun ; Ortega, Eduardo.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  , 2024
Link: https://doi.org/10.1109/..
 
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4

Built-In Self-Test of High-Density and Realistic ILV Layout..:

Chaudhuri, Arjun ; Banerjee, Sanmitra ; Kim, Jinwoo..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  31 (2023)  3 - p. 296-309 , 2023
Link: https://doi.org/10.1109/..
 
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5

Special Session: Using Graph Neural Networks for Tier-Level..:

, In: 2023 IEEE 41st VLSI Test Symposium (VTS),
Hung, Shao-Chun ; Chaudhuri, Arjun ; Banerjee, Sanmitra. - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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6

Test-Point Insertion for Power-Safe Testing of Monolithic 3..:

, In: 2023 IEEE European Test Symposium (ETS),
Hung, Shao-Chun ; Chaudhuri, Arjun ; Chakrabarty, Krishnendu - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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7

Analysis and Characterization of Defects in FeFETs:

, In: 2023 IEEE International Test Conference (ITC),
Thapar, Dhruv ; Thomann, Simon ; Chaudhuri, Arjun.. - p. 256-265 , 2023
Link: https://doi.org/10.1109/..
 
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8

Transferable Graph Neural Network-Based Delay-Fault Localiz..:

Hung, Shao-Chun ; Banerjee, Sanmitra ; Chaudhuri, Arjun...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  42 (2023)  11 - p. 4296-4309 , 2023
Link: https://doi.org/10.1109/..
 
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9

Securing Heterogeneous 2.5D ICs Against IP Theft through Dy..:

, In: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Talukdar, Jonti ; Chaudhuri, Arjun ; Kim, Jinwoo.. - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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10

Innovation Practices Track: Testability and Dependability o..:

, In: 2023 IEEE 41st VLSI Test Symposium (VTS),
Su, Fei ; Zhang, Eric ; Chaudhuri, Arjun. - p. 1-1 , 2023
Link: https://doi.org/10.1109/..
 
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11

Scan Cell Segmentation Based on Reinforcement Learning for ..:

, In: 2023 IEEE International Test Conference (ITC),
Hung, Shao-Chun ; Chaudhuri, Arjun ; Banerjee, Sanmitra. - p. 216-225 , 2023
Link: https://doi.org/10.1109/..
 
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12

Functional Test Generation for AI Accelerators using Bayesi..:

, In: 2023 IEEE 41st VLSI Test Symposium (VTS),
Chaudhuri, Arjun ; Chen, Ching-Yuan ; Talukdar, Jonti. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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13

Bargain effectiveness in differentiated store environments:..:

Doucé, Lieve ; Willems, Kim ; Chaudhuri, Arjun
Journal of Retailing and Consumer Services.  69 (2022)  - p. 103085 , 2022
Link: https://doi.org/10.1016/..
 
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14

Structural Test Generation for AI Accelerators using Neural..:

, In: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Chaudhuri, Arjun ; Banerjee, Sanmitra ; Chakrabarty, Krishnendu - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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15

TaintLock: Preventing IP Theft through Lightweight Dynamic ..:

, In: 2022 IEEE European Test Symposium (ETS),
Talukdar, Jonti ; Chaudhuri, Arjun ; Chakrabarty, Krishnendu - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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