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2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ,
3
Comparative experimental study of junctionless and inversio..:
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2020 IEEE Symposium on VLSI Technology ,
6
All-operation-regime characterization and modeling of drain..:
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2019 IEEE International Electron Devices Meeting (IEDM) ,
8
A Very Robust and Reliable 2.7GHz +31dBm Si RFSOI Transisto..:
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2019 IEEE International Electron Devices Meeting (IEDM) ,
9
Investigation of nBTI degradation on GaN-on-Si E-mode MOSc-..:
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2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ,
10
Back-bias impact on variability and BTI for 3D-monolithic 1..:
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2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) ,
11