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Hartfield, Cheryl
15  Ergebnisse:
Personensuche X
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1

Consideration of a Ga-FIB in Lamella Sample Prep for EBIC A..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Johnson, Gregory M. ; Rummel, Andreas ; Stegmann, Heiko. - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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2

Laser Ablation: A New Approach to APT Specimen Preparation:

Hestad, Samantha ; Pérez-Willard, Fabián ; Hartfield, Cheryl...
Microscopy and Microanalysis.  28 (2022)  S1 - p. 50-51 , 2022
Link: https://doi.org/10.1017/..
 
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3

Emerging Technologies for Advanced 3D Package Characterizat..:

Hartfield, Cheryl ; Harris, Will ; Gu, Allen...
ECS Transactions.  109 (2022)  2 - p. 15-29 , 2022
Link: https://doi.org/10.1149/..
 
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4

New physical analysis capability for counterfeit electronic..:

, In: 2020 IEEE Physical Assurance and Inspection of Electronics (PAINE),
Johnson, Greg M. ; Hartfield, Cheryl ; Mueller, Sascha. - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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5

The LaserFIB: new application opportunities combining a hig..:

Tordoff, Ben ; Hartfield, Cheryl ; Holwell, Andrew J....
Applied Microscopy.  50 (2020)  1 - p. , 2020
Link: https://doi.org/10.1186/..
 
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6

Making the practically impossible "Merely difficult"—Cryoge..:

Parmenter, Christopher D.J. ; Fay, Michael W. ; Hartfield, Cheryl.
Microscopy Research and Technique.  79 (2016)  4 - p. 298-303 , 2016
Link: https://doi.org/10.1002/..
 
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7

Enhancing Materials and Device Analysis Capability in the S..:

Hiscock, Matthew ; Lang, Christian ; Statham, Peter..
Microscopy and Microanalysis.  22 (2016)  S3 - p. 16-17 , 2016
Link: https://doi.org/10.1017/..
 
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8

In-Situ Quantification of TEM Lamella Thickness and Ga Impl..:

Hiscock, Matthew ; Dawson, Michael ; Lang, Christian..
Microscopy and Microanalysis.  20 (2014)  S3 - p. 342-343 , 2014
Link: https://doi.org/10.1017/..
 
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9

Cryogenic FIB Lift-out as a Preparation Method for Damage-F..:

Parmenter, Christopher ; Fay, Michael ; Hartfield, Cheryl..
Microscopy and Microanalysis.  20 (2014)  S3 - p. 1224-1225 , 2014
Link: https://doi.org/10.1017/..
 
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10

Atomic Layer Deposition and Vapor Deposited SAMS in a Cross..:

Principe, E L ; Hartfield, Cheryl ; Kruger, Rocky...
Microscopy Today.  17 (2009)  2 - p. 18-25 , 2009
Link: https://doi.org/10.1017/..
 
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11

Adhesion strength measurement of polymer dielectric interfa..:

Kandula, Soma Sekhar V. ; Hartfield, Cheryl D. ; Geubelle, Philippe H..
Thin Solid Films.  516 (2008)  21 - p. 7627-7635 , 2008
Link: https://doi.org/10.1016/..
 
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12

Hardware and Techniques for Cross- Correlative TEM and Atom..:

Gorman, Brian P ; Diercks, David ; Salmon, Norman...
Microscopy Today.  16 (2008)  4 - p. 42-47 , 2008
Link: https://doi.org/10.1017/..
 
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13

Cellular location of thymus‐leukemia (TL) antigen as shown ..:

Hartfield, Cheryl ; McDowall, Alasdair ; Loveland, Bruce.
Journal of Electron Microscopy Technique.  18 (1991)  2 - p. 148-156 , 1991
Link: https://doi.org/10.1002/..
 
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14

Glacial vicariance and secondary contact shape demographic ..:

Johnson, Nathan A ; Henderson, Andrew R ; Jones, Jess W...
Journal of Heredity.  , 2023
Link: https://doi.org/10.1093/..
 
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15

Pair-bonding leads to convergence in approach behavior to c..:

Rieger, Nathaniel S. ; Monari, Patrick K. ; Hartfield, Kamryn...
PLOS ONE.  16 (2021)  8 - p. e0255295 , 2021
Link: https://doi.org/10.1371/..
 
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