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Proceedings of the 45th annual Design Automation Conference ,
1
Challenges in gate level modeling for delay and SI at 65nm ..:
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Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design ,
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Session details: Emerging topics in signal integrity and re..:
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Proceedings of the 42nd annual Design Automation Conference ,
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Session details: Statistical timing analysis:
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Proceedings of the 40th annual Design Automation Conference ,
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