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2024 IEEE 42nd VLSI Test Symposium (VTS) ,
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Testing a Transistor-Level Programmable Fabric: Challenges ..:
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2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
2
Quo Vadis Signal? Automated Directionality Extraction for P..:
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2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
3
MANTIS: Machine Learning-Based Approximate ModeliNg of Reda..:
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Proceedings of the 59th ACM/IEEE Design Automation Conference ,
4
A defect tolerance framework for improving yield:
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2022 IEEE International Conference on Image Processing (ICIP) ,
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Efficient CNN-Based Super Resolution Algorithms for Mmwave ..:
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2022 IEEE 15th Dallas Circuit And System Conference (DCAS) ,
7
Investigating the Effect of different eFPGAs fabrics on Log..:
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2022 IEEE 15th Dallas Circuit And System Conference (DCAS) ,
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Toward Accurate Timing Analysis for Transistor-Level Progra..:
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2022 IEEE 15th Dallas Circuit And System Conference (DCAS) ,
9
MTBoM: Metal Trace to Bill of Materials Generation for PCB ..:
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2020 57th ACM/IEEE Design Automation Conference (DAC) ,
11
DECOY: DEflection-Driven HLS-Based Computation Partitioning..:
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2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
12
Range-Controlled Floating-Gate Transistors: A Unified Solut..:
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2020 IEEE 38th VLSI Test Symposium (VTS) ,
13
ATTEST: Application-Agnostic Testing of a Novel Transistor-..:
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Proceedings of the 57th ACM/EDAC/IEEE Design Automation Conference ,
14
DECOY : deflection-driven HLS-based computation partitio..:
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Proceedings of the 23rd Conference on Design, Automation and Test in Europe ,
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