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2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD) ,
1
Ultra-Fast Positive Gate Bias Stress (<100ns) to Understand..:
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2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD) ,
4
Novel Topology with Continuous Switching to Comprehensively..:
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2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
6
Comprehensive Investigation of the Switching Stability in S..:
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2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
15