Yoon, Jun‐Yeong
80  Ergebnisse:
Personensuche X
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6

TEM Imaging of Edges and Point Defects in Monolayer Phospho..:

Lee, Yangjin ; Lee, Sol ; Yoon, Jun-Yeong...
Microscopy and Microanalysis.  26 (2020)  S2 - p. 2348-2350 , 2020
 
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7

TEM Imaging and Electron Diffraction of Vertically Stacked ..:

Lee, Sol ; Lee, Yangjin ; Yoon, Jun-Yeong.
Microscopy and Microanalysis.  25 (2019)  S2 - p. 2114-2115 , 2019
 
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13

Atomic-scale imaging of few-layer black phosphorus and its ..:

Lee, Yangjin ; Yoon, Jun-Yeong ; Scullion, Declan...
Journal of Physics D: Applied Physics.  50 (2017)  8 - p. 084003 , 2017
 
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