Yamada, Hiroshi
9809  Ergebnisse:
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2

Automatic high-speed smartphone disassembly system:

Ueda, Takao ; Fukusawa, Hideaki ; Nakagawa, Yukimi...
Journal of Cleaner Production.  434 (2024)  - p. 139928 , 2024
 
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Supports for Testing Memory Error Handling Code of In-memor..:

, In: 2024 19th European Dependable Computing Conference (EDCC),
Nezu, Naoya ; Yamada, Hiroshi - p. 41-48 , 2024
 
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