Amato, Carlo
179  results:
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1

Increasing biases can be more efficient than increasing wei..:

, In: 2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV),
Metta, Carlo ; Fantozzi, Marco ; Papini, Andrea... - p. 2798-2807 , 2024
 
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2

How the polychromatic retrigger can increase the count-rate..:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),
Amato, C. ; Disch, C. - p. 1-1 , 2023
 
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3

Contributors:

, In: Resilient and Sustainable Cities,
 
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4

Mixed FTS/H∞ Control for Nonlinear Quadratic Systems Subjec..:

, In: 2023 31st Mediterranean Conference on Control and Automation (MED),
 
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5

On-Robot Bayesian Reinforcement Learning for POMDPs:

, In: 2023 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS),
Nguyen, Hai ; Katt, Sammie ; Xiao, Yuchen. - p. 9480-9487 , 2023
 
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6

Using Wearable Sensors and Motion Parameters for Recognizin..:

, In: 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE),
Pisani, Noemi ; Ricciardi, Carlo ; Picillo, Marina... - p. 864-869 , 2023
 
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7

A combined simulation and machine learning approach to clas..:

, In: 2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE),
 
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8

A Sensitivity Analysis of Symbolic Dynamics indices for Fet..:

, In: 2022 E-Health and Bioengineering Conference (EHB),
 
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9

Input-Output Finite-Time Stability and State-Feedback Stabi..:

, In: 2022 IEEE 17th International Conference on Control & Automation (ICCA),
 
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10

Breast Density Analysis on Mammograms: Application of Machi..:

, In: 2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE),
 
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11

Area Under the ROC Curve Maximization for Metric Learning:

, In: 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW),
Gajic, Bojana ; Amato, Ariel ; Baldrich, Ramon.. - p. 2806-2815 , 2022
 
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12

Mobile Systems Secure State Management:

, In: 2022 25th Euromicro Conference on Digital System Design (DSD),
Amato, Paolo ; Izzo, Niccolo ; Meijer, Carlo - p. 564-571 , 2022
 
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13

Fiber optic plant wearable sensors for growth and microclim..:

, In: 2022 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT),
 
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14

Combining simulation and machine learning for the managemen..:

, In: 2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE),
 
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