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X
Li, Song-bai
2035  results:
Bookchapter (Online) X
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1

The Vulnerability Analysis of Power Cyber Physical System B..:

, In: 2023 8th International Conference on Intelligent Computing and Signal Processing (ICSP),
Li, Song Bai ; Mu, Ze Xin ; Hu, Yuan Ting... - p. 617-623 , 2023
Link: https://doi.org/10.1109/..
 
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2

Application Conditions of Binomial Regression Method for Re..:

, In: Springer Series in Geomechanics and Geoengineering; Proceedings of the International Field Exploration and Development Conference 2023,
Zhu, Song-bai ; Sun, He-dong ; Xian, Bo... - p. 940-949 , 2024
Link: https://doi.org/10.1007/..
 
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3

Study on Casing Strength Check Under Superimposed Complex W..:

, In: Springer Series in Geomechanics and Geoengineering; Proceedings of the International Field Exploration and Development Conference 2023,
Zhang, Lei ; Tang, Bai-song ; Li, Zhi-heng... - p. 496-513 , 2024
Link: https://doi.org/10.1007/..
 
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4

Research on Reasonable Development Method of Layered Gas Ca..:

, In: Springer Series in Geomechanics and Geoengineering; Proceedings of the International Field Exploration and Development Conference 2020,
Zeng, Xue-mei ; Wu, Jia-yi ; Liu, Bai-song... - p. 1401-1411 , 2021
Link: https://doi.org/10.1007/..
 
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5

The Seventh Visual Object Tracking VOT2019 Challenge Result:

, In: 2019 IEEE/CVF International Conference on Computer Vision Workshop (ICCVW),
Kristan, Matej ; Matas, Jiri ; Leonardis, Ales... - p. 2206-2241 , 2019
Link: https://doi.org/10.1109/..
 
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6

SRFormer: Permuted Self-Attention for Single Image Super-Re..:

, In: 2023 IEEE/CVF International Conference on Computer Vision (ICCV),
Zhou, Yupeng ; Li, Zhen ; Guo, Chun-Le... - p. 12734-12745 , 2023
Link: https://doi.org/10.1109/..
 
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7

Fabrication and Characterization of 750V SiC MOSFET for New..:

, In: 2023 20th China International Forum on Solid State Lighting & 2023 9th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS),
Guo, Rui ; Li, Shiyan ; Yang, Xiaolei... - p. 57-60 , 2023
Link: https://doi.org/10.1109/..
 
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8

Research on the technique of accurately measuring thermal r..:

, In: 2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS),
Liu, Ao ; Zhang, Guobin ; Liu, Tao... - p. 30-33 , 2023
Link: https://doi.org/10.1109/..
 
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9

Design of an Integrated System for the Train Working Diagra..:

, In: Advances in Smart Vehicular Technology, Transportation, Communication and Applications; Smart Innovation, Systems and Technologies,
Gao, Fan ; Chen, Xu ; Zeng, Xiaoxu... - p. 161-174 , 2023
Link: https://doi.org/10.1007/..
 
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10

Research of Cell Topology on Characteristics of 750V SiC MO..:

, In: 2023 20th China International Forum on Solid State Lighting & 2023 9th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS),
Huang, Runhua ; Zhang, Yue ; Liu, Tao... - p. 53-56 , 2023
Link: https://doi.org/10.1109/..
 
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11

RIS-Empowered Phase and Code Index Modulation:

, In: 2023 8th International Conference on Computer and Communication Systems (ICCCS),
Bai, Song ; Li, Qiang ; Cai, Donghong. - p. 6-11 , 2023
Link: https://doi.org/10.1109/..
 
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12

Fabrication of Low Parasitic 750V/800A 4H-SiC Power MOSFET ..:

, In: 2023 20th China International Forum on Solid State Lighting & 2023 9th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS),
Wang, Deping ; Hao, Fengbin ; Yang, Yang... - p. 133-135 , 2023
Link: https://doi.org/10.1109/..
 
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13

Investigation of Parasitic Capacitance Effects in V-GAA Tra..:

, In: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Liang, Hong-Gang ; Yu, Yong ; Xiao, De-Yuan... - p. 1-3 , 2022
Link: https://doi.org/10.1109/..
 
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14

High temperature performance of 6500V 4H-SiC MOSFET With em..:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Chen, Hang ; Zhang, Yourun ; Luo, Maojiu... - p. 198-200 , 2022
Link: https://doi.org/10.1109/..
 
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15

Hybrid Gate p-GaN Power HEMTs Technology for Enhanced Vth S..:

, In: 2022 International Electron Devices Meeting (IEDM),
Zhang, Chi ; Li, Sheng ; Liu, Siyang... - p. 35.4.1-35.4.4 , 2022
Link: https://doi.org/10.1109/..
 
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