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Patil, Khushabu
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Improvement in Electrical Properties of A1/La2O3/ZrO2/ Gate..:

, In: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Barhate, Viral N. ; Agrawal, Khushabu S. ; Patil, Vilas S.. - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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